2021
DOI: 10.1016/j.matchar.2021.111419
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Reveal the stacking fault shearing mechanism by its annihilation process in Ni-based single crystal superalloys

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Cited by 12 publications
(2 citation statements)
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“…However, the microscopic changes such as stacking fault nucleation and dislocation movement during the deformation process of single-crystal nickel-based alloys are difficult to observe intuitively. Therefore, we established a single-crystal nickel nanopillar model and simulated the tensile deformation process of the nanopillar through molecular dynamics. We investigated the influence of loading methods on the dislocation motion, established the deformation mechanism at different temperatures, and analyzed the influence mechanism of hole defects in twin boundaries with different spacing on the dislocation nucleation process.…”
Section: Introductionmentioning
confidence: 99%
“…However, the microscopic changes such as stacking fault nucleation and dislocation movement during the deformation process of single-crystal nickel-based alloys are difficult to observe intuitively. Therefore, we established a single-crystal nickel nanopillar model and simulated the tensile deformation process of the nanopillar through molecular dynamics. We investigated the influence of loading methods on the dislocation motion, established the deformation mechanism at different temperatures, and analyzed the influence mechanism of hole defects in twin boundaries with different spacing on the dislocation nucleation process.…”
Section: Introductionmentioning
confidence: 99%
“…Stacking faults are known to form during film growth and plastic deformation, and they are typically not considered to be a factor during spinodal decomposition due to the high temperatures involved. In fact, high temperature annealing (T ≥ 0.68 T melt ) has been used as means to annihilate SFs in certain materials [25,26]. Also, transition metal nitrides are known to have high stacking fault energies (SFE) [27][28][29], which should suppress their formation.…”
mentioning
confidence: 99%