2006
DOI: 10.1103/physrevb.73.045103
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Abstract: We study the distribution of resonance widths P(Γ) for three-dimensional (3D) random scattering media and analyze how it changes as a function of the randomness strength. We are able to identify in P(Γ) the system-inherent fingerprints of the metallic, localized, and critical regimes. Based on the properties of resonance widths, we also suggest a new criterion for determining and analyzing the metal-insulator transition. Our theoretical predictions are verified numerically for the prototypical 3D tight-bindin…

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