DOI: 10.1103/physrevb.73.045103
View full text
Sign up to set email alerts

Abstract: We study the distribution of resonance widths P(Γ) for three-dimensional (3D) random scattering media and analyze how it changes as a function of the randomness strength. We are able to identify in P(Γ) the system-inherent fingerprints of the metallic, localized, and critical regimes. Based on the properties of resonance widths, we also suggest a new criterion for determining and analyzing the metal-insulator transition. Our theoretical predictions are verified numerically for the prototypical 3D tight-bindin…

Expand abstract