volume 144, issue 1-3, P60-63 2007
DOI: 10.1016/j.mseb.2007.07.059
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Abstract: X-ray absorption spectroscopy was used to study the microscopic origin of conductance and resistive switching in chromium-doped strontium titanate (Cr:SrTiO 3 ). Differences in the X-ray absorption near edge spectroscopy (XANES) at the Cr K-edge indicate that the valence of Cr changes from 3+ to 4+ underneath the anode of our sample device after the application of an electric field. Spatially resolved X-ray fluorescence microscopy (-XRF) maps show that the Cr 4+ region retracts from the anode-Cr:SrTiO 3 inter…

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