2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2016
DOI: 10.1109/radecs.2016.8093143
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Register file criticality on embedded microprocessor reliability

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Cited by 4 publications
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“…This observed trend is also consistent with the results of other studies conducted under similar experimental conditions. This is a study that performed a neutron beam test by synthesizing a AES circuit [36,[42][43][44]. Beam testing was performed on the entire memory, but the bitstreams synthesized in the memory were different depending on the option.…”
Section: Resultsmentioning
confidence: 99%
“…This observed trend is also consistent with the results of other studies conducted under similar experimental conditions. This is a study that performed a neutron beam test by synthesizing a AES circuit [36,[42][43][44]. Beam testing was performed on the entire memory, but the bitstreams synthesized in the memory were different depending on the option.…”
Section: Resultsmentioning
confidence: 99%