“…Importantly, the fields do not have to be identical replicas of each other. In addition, the reconstruction of the two interfering fields has applications in retracing the fields and determining their origins; simultaneously testing the quality of two surfaces of an optical component from which the interfering fields are reflected or transmitted; and finding the optical parameters of an element, such as the thickness, radii of curvature, and refractive index of a lens [5,[10][11][12]. So the method opens new possibilities for holography, wavefront sensing, and metrology.…”