2015
DOI: 10.1039/c5ta00935a
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Real-time X-ray scattering studies of film evolution in high performing small-molecule–fullerene organic solar cells

Abstract: Comprehensive studies of the influence of the formulation additive 1,8-diiodooctane on the structural evolution of small molecule BHJ films with GIWAXS and GISAXS are presented.

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Cited by 42 publications
(80 citation statements)
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“…More recently, Richter and DeLongchamp et al used real-time X-ray diffraction to understand the solvent additive effect in polymer:fullerene and small-molecules:fullerene solar cells. [36,37] It has been shown that realtime X-ray diffraction is a powerful tool to track down the polymer crystallization during the drying process.…”
mentioning
confidence: 99%
“…More recently, Richter and DeLongchamp et al used real-time X-ray diffraction to understand the solvent additive effect in polymer:fullerene and small-molecules:fullerene solar cells. [36,37] It has been shown that realtime X-ray diffraction is a powerful tool to track down the polymer crystallization during the drying process.…”
mentioning
confidence: 99%
“…This observation is consistent with the minor solution crystallization observed in our previous study. [ 56 ] The solubility limit for p-DTS(FBTTh 2 ) 2 in CB at the sample stage temperature of 40 °C has been estimated to be (45 ± 5) mg mL −1 . [ 24 ] In case of the BHJ without DIO the strong absorbance increase occurs at concentrations of (212 ± 59) mg mL −1 total solid content in solvent.…”
Section: Wileyonlinelibrarycommentioning
confidence: 99%
“…[ 23,54,55 ] The increased device performance for BHJs processed with DIO compared to fi lms prepared without DIO was attributed to the increased domain order, purity and domain sizes. [ 55 ] Addition of "large" amounts of DIO (e.g., volume fractions of 1%) was found to lead to excessive crystallization and domain coarsening [ 56 ] and subsequently device failure. In contrast to polymer-based BHJs, the extent of crystallization is not self-limited.…”
Section: Morphology Evolution In P-dts(fbtth 2 ) 2 /[70]pcbmmentioning
confidence: 99%
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