Abstract:Testing of RF circuits for gain, nonlinearity and distortion specification generally requires the use of multiple test measurements and long test times contributing to increased test cost. Prior RF test methods have suffered from significant test calibration effort (training for supervised learners) when using compact tests or from increased test time due to direct specification measurement. In this paper, a novel RF test methodology is developed that: (a) allows RF devices to be tested for amplitude and phase… Show more
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