Raman spectroscopy of ion irradiated SiC: chemical defects, strain, annealing, and oxidation

Leide, Alexander J.; Lloyd, Matthew J.; Todd, Richard I.; Armstrong, David E.J.

doi:10.48550/arxiv.2004.14335

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2024

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“…The molecular vibration, sample density, and lattice damage induced by ion implantation [34] can be reflected by the Raman spectra. The Raman spectra were measured at different depths of the H-and C-ion-implanted Nd:YLF samples: the electronic-energy-lossdominant region, nuclear-energy-loss-dominant region, and substrate region, respectively.…”

Section: Resultsmentioning

confidence: 99%

Lattice Damage, Optical and Electrical Properties Induced by H and C Ions Implantation in Nd:YLF Crystals

Qiao,

Wang,

Liu

et al. 2024

Crystals

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Neodymium-doped yttrium fluoride crystal has emerged as one of the most valuable functional materials, and has thus become a research hotspot and shown promising application value in recent years. In this work, utilizing 460 keV H and 6.0 MeV C ions implantation, the damage behavior, lattice structure change, spectral, and electrical characteristics of the Nd:YLF crystal induced by electronic and nuclear energy loss were investigated, utilizing complementary characterization techniques (X-ray diffraction, hardness and elastic (Young’s) modulus, micro-Raman, absorption, fluorescence spectra, and I–V characteristic curve). Thus, the annealing effect on the waveguide properties and the surface damage of the samples was discussed. The fabricated waveguide structure shows potential application in highly sensitive optoelectronic sensors.

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Section: Resultsmentioning

confidence: 99%