Abstract:Imaging fluorescence spectroscopy proves to be a fast and sensitive method for measuring the thickness of thin coatings in the manufacturing industry. This encouraged us to systematically study, theoretically and experimentally, parameters that influence the fluorescence of thin layers. We analyzed the fluorescence signal as a function of the scattering and reflectance properties of the sample substrate. In addition, we investigated effects of the layer properties on fluorescence emission. A ray-tracing softwa… Show more
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