Quantitative evaluation of the oxygen content in YBa2Cu3O7−δ epitaxially grown thin films using near-infrared excited Raman spectrometry

Analysis of grain orientation and intergrain properties by micro-Raman spectroscopy in YBa2Cu3O7−x thin films

“…8 This orientation is determined by different factors: i.e., the growth temperature, the substrate nature and preparation, the lattice mismatch between the film and the substrate, the film thickness, etc. [17][18][19][20][21] When attached to an optical microscope, small submicrometric areas can be analyzed, which allows study of inhomogeneities of the films at both short and long range. 5,11,12 Extensive work has been carried out in order to study the epitaxiality of YBCO films; [13][14][15][16] however, it has been generally studied as an average property, without detailed analysis of the short-range spatial fluctuations.…”