2001
DOI: 10.1557/proc-692-h11.5.1
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Pulsed Laser Deposition and Characterization of Zn1−xMnxO Films

Abstract: Here we present our results of structural, optical, and magnetic measurements of Znj_ ,MnO thin films. These films were grown epitaxially on (0001) sapphire substrates by using pulsed laser deposition technique. The maximum Mn content (x=0.36) is found to be much higher than allowed by thermal equlibrium limit (x-0.13) due to the non-equilibrium nature of the pulsed laser deposition. All the films investigated here were found to be single phase with <0001> orientation epitaxial relationship. A linear increase … Show more

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