1974
DOI: 10.1016/0029-554x(74)90831-3
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Proton induced X-ray emission as a tool for trace element analysis

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Cited by 274 publications
(41 citation statements)
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“…Higher analysis sensitivity is achieved in the determination of trace elements in rather light matrices, which absorb x rays poorly. A negative aspect of thick-layer analysis is the reduction of sensitivity by approximately one order of magnitude in comparison with that achieved in the analysis of thin layers [7]. LITERATURE CITED…”
Section: %)mentioning
confidence: 99%
“…Higher analysis sensitivity is achieved in the determination of trace elements in rather light matrices, which absorb x rays poorly. A negative aspect of thick-layer analysis is the reduction of sensitivity by approximately one order of magnitude in comparison with that achieved in the analysis of thin layers [7]. LITERATURE CITED…”
Section: %)mentioning
confidence: 99%
“…(2) Total K-shell excitation cross sections generally appear to be well under control (11) and the behavior of the impact-parameter-dependent excitation corroborates the model. (3) Recent studies, however, revealed significant differences between the results of total (4 ) and differential excitation U5 -17 ) cross section measurements and the corresponding theoretical predictions. (12) The now generally used quantitative picture, which rests on the basic 2pa-2pn coupling mechanism, should therefore be put to more rigorous tests.…”
mentioning
confidence: 92%
“…(11 Quantitative knowledge of inner-shell processes have become important in several different fields, for example, astrophysics, (2) trace element analysis, (3) search for superheavy elements, (4) positron creation in supercritical fields, (5) and x-ray laser development. (6) Two main regions of interest have emerged, each encompassing the development of successful theoretical descriptions.…”
mentioning
confidence: 99%
“…The mean multiple-scattering angle is of the order of several radians, so one cannot assume the electrons travel in a straight line after being emitted. With these assumptions, the cross section is given by (Anhol t et al 1986, Folkmann et al 1973, Ishii et al 1977)…”
Section: B Secondary Electron Bremsstrahlungmentioning
confidence: 99%