2013
DOI: 10.1134/s1063782613070233
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Properties of Sb2S3 and Sb2Se3 thin films obtained by pulsed laser ablation

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Cited by 27 publications
(11 citation statements)
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“…For example, in Table 2 the results [17][18][19][20][21][22][23][24][25][26][27][28][29][30][31][32] on a wide variety of thin films are presented and compared with the results obtained in this investigation. Regarding In 2 S 3 thin films, it is possible to observe similar features except for a blue-shift on band gap in the SILAR technique.…”
Section: Structure and Morphologymentioning
confidence: 93%
“…For example, in Table 2 the results [17][18][19][20][21][22][23][24][25][26][27][28][29][30][31][32] on a wide variety of thin films are presented and compared with the results obtained in this investigation. Regarding In 2 S 3 thin films, it is possible to observe similar features except for a blue-shift on band gap in the SILAR technique.…”
Section: Structure and Morphologymentioning
confidence: 93%
“…The distance from the target to the substrates was 2 cm. PbTe films having different thicknesses were deposited at 200°C by applying different pulse numbers (deposition times) and keeping other growth parameters constant [16]. The film thicknesses were 40, 80, 120, 400 and 1800 nm (710 nm) which was estimated based on thickness measurements of the films grown on Si substrates.…”
Section: Methodsmentioning
confidence: 99%
“…The latter substrates were prepared by depositing an Si 3 N 4 buffer layer on Si(111) by PLD. [10][11][12] The Si 3 N 4 layer thickness was 110 nm. The thickness of each lead chalcogenide film was 2 lm.…”
Section: Methodsmentioning
confidence: 99%