1996
DOI: 10.1116/1.580011
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Properties of radio frequency–sputtered alumina films on flat and grooved substrates

Abstract: Influence of the target-substrate distance on the properties of indium tin oxide films prepared by radio frequency reactive magnetron sputtering Mechanical and chemical properties of rf-diode sputtered alumina films have been measured as a function of deposition conditions including substrate bias, bias phase, and sputter power. Similar films were deposited over grooved substrates, and the effect of the grooves on film microstructure and intrinsic stress was examined. Films deposited over nonplanar substrates … Show more

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Cited by 8 publications
(5 citation statements)
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References 14 publications
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“…The observed hardness value of the a -Al 2 O 3 film was found to be slightly higher than the reported value (8.1 ± 1.3 GPa at a load of 0.5 mN) . Also, the measured average elastic modulus of the amorphous thin film lies within the reported range (70–190 GPa). Nanoindentation on SH hierarchical nanoflakelets exhibited a reduction in the average hardness (2.08 ± 1.61 GPa) and elastic modulus (84.1 ± 40.7 GPa) compared to smooth a -Al 2 O 3 thin film (≈134 GPa). The AlOOH nanostructure was affected by various microscopic factors, notably the porosity, inelastic layer slippage, decrease of hydrogen bonds, voids in the octahedral boehmite crystal structure, and weak bonding between the layered structures of boehmite.…”
Section: Resultsmentioning
confidence: 53%
“…The observed hardness value of the a -Al 2 O 3 film was found to be slightly higher than the reported value (8.1 ± 1.3 GPa at a load of 0.5 mN) . Also, the measured average elastic modulus of the amorphous thin film lies within the reported range (70–190 GPa). Nanoindentation on SH hierarchical nanoflakelets exhibited a reduction in the average hardness (2.08 ± 1.61 GPa) and elastic modulus (84.1 ± 40.7 GPa) compared to smooth a -Al 2 O 3 thin film (≈134 GPa). The AlOOH nanostructure was affected by various microscopic factors, notably the porosity, inelastic layer slippage, decrease of hydrogen bonds, voids in the octahedral boehmite crystal structure, and weak bonding between the layered structures of boehmite.…”
Section: Resultsmentioning
confidence: 53%
“…6 that the standard MSE significantly overpredicts the damping while the modified version gives a slight underprediction. Note that loss factor curves for other modes were similar in shape to those presented: maximum levels were identical but [11,30]. In the more general case, however, where FE models are used, the modal stiffness (i.e.…”
Section: Methodsmentioning
confidence: 56%
“…. For a simple structure such as beams, closed-form expressions for these parameters have been obtained based on the classical Ross, Kerwin and Ungar (RKU) analysis [11,30]. In the more general case, however, where FE models are used, the modal stiffness (i.e.…”
Section: Methodsmentioning
confidence: 99%
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“…Amorphous alumina (aluminum oxide) thin films have many applications and have attracted much attention during the past 20 years [1]. Aluminum oxide thin films are widely used in many mechanical, optical and microelectronic applications [2].…”
Section: Introductionmentioning
confidence: 99%