Precursors' order effect on the properties of sulfurized Cu<sub>2</sub>ZnSnS<sub>4</sub>thin films

Fernandes, Paulo A.; Salomé, Pedro M. P.; Cunha, A. F. da

doi:10.1088/0268-1242/24/10/105013

Cited by 111 publications

(75 citation statements)

References 21 publications

(44 reference statements)

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“…Cu 2−x S phases are easy to identify in XRD when in a phase mixture with CZTS because its diffraction peaks are clearly distinct from the CZTS ones. Cu 2−x S phases can also be easily removed with a KCN treatment [11] and thus are not seen as a problem.…”

Section: Xrd Analysismentioning

confidence: 99%

“…layers using dc-magnetron sputtering and a final annealing /sulphurization process [11][12][13]. The process starts with the substrate cleaning (3×3 cm 2 soda lime glass) which consist in successive ultrasound baths of acetone/ethanol/deionised water and its subsequent drying process with a N 2 flow.…”

Section: Preparation Of the Filmsmentioning

confidence: 99%

“…The metallic precursors were deposited sequentially using dc-magnetron sputtering for the ternary and quaternary compounds. The deposition order used was Mo/Zn/Cu/Sn/ and /Sn/Cu/ for CZTS and CTS, respectively [11,12]. For the growth of the binary sulphides only 1 deposition was necessary [13].…”

Section: Preparation Of the Filmsmentioning

confidence: 99%

“…Unwanted phases, such as Cu 2−x S, that were formed during the CZTS and CTS crystallization process were eliminated using a KCN chemical treatment [11]. The samples were, sequentially, submitted to the KCN solution at 10 % w/w, a solution of ethanol/deionised water at 50 % vol/vol and finally deionised water.…”

Section: Preparation Of the Filmsmentioning

confidence: 99%

“…The experimental procedure described in the section is based in previously published work [2,[10][11][12][13], except for the growth of the cubic-ZnS phase.…”

Section: Introductionmentioning

confidence: 99%

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Study of polycrystalline Cu2ZnSnS4 films by Raman scattering

Fernandes

Salomé

Cunha

2011

Journal of Alloys and Compounds

659

337

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Cu 2 ZnSnS 4 (CZTS) is a p-type semiconductor that has been seen as a possible low-cost replacement for Cu(In,Ga)Se 2 in thin film solar cells. So far compound has presented difficulties in its growth, mainly, because of the formation of unwanted phases like ZnS, Cu x SnS x+1 , Sn x S y , Cu 2−x S and MoS 2 . X-ray diffraction analysis (XRD), which is mostly used for phase identification cannot resolve some of these phases from the kesterite/stannite CZTS and thus the use of a complementary technique is needed. Raman scattering analysis can help distinguishing these phases not only laterally but also in depth. Knowing the absorption coefficient and using different excitation wavelengths in Raman scattering analysis, one is capable of profiling the different phases present in multi-phase CZTS thin films.This work describes in a concise form the methods used to grow chalcogenide compounds, such as, CZTS, Cu x SnS x+1 , Sn x S y and cubic ZnS based on the sulphurization of stacked metallic precursors. The results of the films' characterization by XRD, electron backscattered diffraction and scanning electron microscopy/energy dispersive spectroscopy techniques are presented for the CZTS phase. The limitation of XRD to identify some of the possible phases that can remain after the sulphurization process are investigated. The results of the Raman analysis of the phases formed in this growth method and the advantage of using this technique in identifying them are presented. Using different excitation wavelengths it is also analysed the CZTS film in depth showing that this technique can be used as non destructive methods to detect unwanted phases.

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Section: Xrd Analysismentioning

confidence: 99%

Section: Preparation Of the Filmsmentioning

confidence: 99%

Section: Preparation Of the Filmsmentioning

confidence: 99%

Section: Preparation Of the Filmsmentioning

confidence: 99%

“…The experimental procedure described in the section is based in previously published work [2,[10][11][12][13], except for the growth of the cubic-ZnS phase.…”

Section: Introductionmentioning

confidence: 99%

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