2016
DOI: 10.1017/s1431927616004037
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Practical Considerations for High-Resolution Transmission Kikuchi Diffraction Mapping and Analysis in Titanium Alloys

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“…Crystallographic orientation mapping was performed using Transmission Kikuchi Diffraction (TKD) methods [33][34][35] on a FEI XL-30 ESEM scanning electron microscope with an EDAX Hikari camera. A custom sample holder was used to hold focused ion beam (FIB) prepared transmission electron microscope (TEM) foils at -20 o tilt.…”
Section: Experimental Observations Of Defects Generation During Transmentioning
confidence: 99%
“…Crystallographic orientation mapping was performed using Transmission Kikuchi Diffraction (TKD) methods [33][34][35] on a FEI XL-30 ESEM scanning electron microscope with an EDAX Hikari camera. A custom sample holder was used to hold focused ion beam (FIB) prepared transmission electron microscope (TEM) foils at -20 o tilt.…”
Section: Experimental Observations Of Defects Generation During Transmentioning
confidence: 99%