We describe a simple method to assign a diagnosis of cataract to patients with obscurely impaired vision as well as to those with mild lens opacities. When the narrowest slit is used in a slitlamp examination, a small beam of light appears on the macula. Routine fundoscopy with the 78.0 diopter lens or a 3-mirror glass is appropriate. If a cataract is present, the beam of light is scattered into several straight lines, distorted lines, or both. This has proved a useful diagnostic tool when the lens appears clear but the patient's vision is impaired, and extensive examinations such as computer tomography or nuclear magnetic resonance tomography for impaired vision may be avoided. The beam-deflection method uses devices that are generally available and can detect cataract in the early stages of development. J Cataract Refract Surg 2001; 27:994 -999 © 2001 ASCRS and ESCRS I n cases of mild cataract with faint lens opacities, it may be difficult to find the cause of obscurely impaired vision. The ophthalmologist may fail to recognize zones of increased light scattering in the nuclear region of the crystalline lens when brunescence is not present. Thus, unremarkable morphology of the eye compartments calls for intensive evaluation including perimetry, electrophysiology, and neuroradiology. These examinations may be avoided by using a simple method we developed to clarify the diagnosis of impaired vision caused by cataract. This beam-deflection approach complements the classic methods of investigation, which typically consist of slitlamp examination with lateral light, Scheimpflug imaging, 1 and laser scattering.
2During fundus examinations with the 3-mirror glass, we observed that the slitlamp's beam was deformed by lens opacities. This phenomenon was only visible at the appropriate slitlamp setting; that is, coaxial light, slightly defocused. This article describes our technique to evaluate vision impaired by cataract, its clinical application, and the optical explanation of the beamdeflection phenomenon.
Technique
ExaminationThe slitlamp's illumination beam is aligned coaxially with the microscope's viewing axis. The height of the slit is limited by the pupillary aperture, and its width is set as narrow as possible. For the adjustment, the slit is totally closed at first and then slightly reopened.The slit is focused on the macula to arrange the slitlamp, the patient, and the mirror glass in proper position. A 3-mirror glass or a 78 diopter magnifying lens is used. To produce the beam-deflection phenomenon,