2009
DOI: 10.1134/s1063778809100081
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Positronics and nanotechnologies: Possibilities of studying nanoobjects in materials and nanomaterials by the method of positron-annihilation spectroscopy

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Cited by 6 publications
(3 citation statements)
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“…It is seen from the figure, where the behavior of the curves differ markedly, that in the case of samples series 2 we have a two-phase system consisting of a-Si 3 N 4 and (Ti, Hf)N. Namely, a two-phase coating is characterized by two peaks (increase S-parameter) in the region of 10 keV and then in the region of 20 keV (near the coating-substrate interface). In the case of samples Series 3, we have a single-phase solid solution of (Ti, Hf)N and the S-parameter value is rather high -0.492 and after reaching the film-substrate interface begins to decrease to value of 0.476 [9][10][11][12]. Figure 7(a)) with the lowest Hf content in solid solution (Ti, Hf)N ( Table 1) has the greatest wear resistance.…”
Section: Resultsmentioning
confidence: 97%
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“…It is seen from the figure, where the behavior of the curves differ markedly, that in the case of samples series 2 we have a two-phase system consisting of a-Si 3 N 4 and (Ti, Hf)N. Namely, a two-phase coating is characterized by two peaks (increase S-parameter) in the region of 10 keV and then in the region of 20 keV (near the coating-substrate interface). In the case of samples Series 3, we have a single-phase solid solution of (Ti, Hf)N and the S-parameter value is rather high -0.492 and after reaching the film-substrate interface begins to decrease to value of 0.476 [9][10][11][12]. Figure 7(a)) with the lowest Hf content in solid solution (Ti, Hf)N ( Table 1) has the greatest wear resistance.…”
Section: Resultsmentioning
confidence: 97%
“…For the analysis of vacancy-type defects in the coatings slow positrons microbeam (Halle, Germany) was applied. Using this method the so called S-parameter was measured as a function of the incident positrons beam energy (1 -20 keV) with the depth of analysis from a few nm to 2.1 µm [8][9][10]. Investigation of mechanical characteristics of the layers was carried by nanoindentation on the device Nanoindenter G200 (MES Systems, USA) with a three-sided Berkovich diamond pyramid with a radius of blunting the apex of about 20 nm.…”
Section: Methodsmentioning
confidence: 99%
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