1994
DOI: 10.1088/0022-3727/27/6/035
|View full text |Cite
|
Sign up to set email alerts
|

Porosity superlattices: a new class of Si heterostructures

Abstract: Porosity superlattices have been investigated by transmission electron microscopy, photoluminescence and reflectance spectroscopy. The superlattices were formed on p-type doped Si using two different techniques. Firstly, for homogeneously doped substrates we have periodically varied the formation current density and thereby the porosity. Secondly, the current density was kept constant while etching was performed on periodically doped Si layers. For the first type of superlattices the layer thicknesses were det… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
63
0

Year Published

1999
1999
2016
2016

Publication Types

Select...
9

Relationship

0
9

Authors

Journals

citations
Cited by 163 publications
(63 citation statements)
references
References 8 publications
0
63
0
Order By: Relevance
“…Estimated thickness of the basic layer was about six times the thickness of the auxiliary layer. Calculations of geometry and porosity of the layers were based on data depending on density of the dc current and duration of etching [14,15]. Contacts were made by vacuum evaporation of aluminium and subsequent annealing at temperature of 450 • C in nitrogen atmosphere.…”
Section: Methodsmentioning
confidence: 99%
“…Estimated thickness of the basic layer was about six times the thickness of the auxiliary layer. Calculations of geometry and porosity of the layers were based on data depending on density of the dc current and duration of etching [14,15]. Contacts were made by vacuum evaporation of aluminium and subsequent annealing at temperature of 450 • C in nitrogen atmosphere.…”
Section: Methodsmentioning
confidence: 99%
“…More dense auxiliary PSi * layer was formed in the first phase. From the density of anodic current [9], the porosity of the auxiliary layer was estimated to be about 55%, and its thickness was about 3-5 µm. The basic layer of porous silicon (PSi * * ) was formed in the second phase.…”
Section: Methodsmentioning
confidence: 99%
“…The light passed at normal incidence through the grating sample in the chamber. [1][2][3][4][5][6][7][8] The new glasses constitute a significant extension of silicate glass compositions and also show high chemical flexibility. Samples have been prepared with high concentrations of alkaline-earth and rare-earth elements such as Ca, Sr, Ba, La, Pr, and Sm (higher than 50 % cations; hereafter cation %).…”
Section: Methodsmentioning
confidence: 99%
“…For example, highly reflective porous silicon microcavities can be generated by using controlled etching, resulting in layers of alternating porosities. [2,3] Recently, excellent progress has been made in creating porous silicon films, [4,5] microcavities, [6,7] and arrays of microstructures [8] useful for optical sensing. Generally, these devices rely on the changes in the optical resonance that occur when the porous structure is occupied by the analyte species, allowing for simple and effective detection schemes.…”
mentioning
confidence: 99%