2022
DOI: 10.1002/adma.202205066
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Polishing the Lead‐Poor Surface for Efficient Inverted CsPbI3 Perovskite Solar Cells

Abstract: Triiodide cesium lead perovskite (CsPbI3) has promising prospects in the development of efficient and stable photovoltaics in both single‐junction and tandem structures. However, achieving inverted devices that provide good stability and are compatible to tandem devices remains a challenge, and the deep insights are still not understood. This study finds that the surface components of CsPbI3 are intrinsically lead‐poor and the relevant traps are of p‐type with localized states. These deep‐energy‐level p traps … Show more

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Cited by 56 publications
(39 citation statements)
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“…A larger V bi value means an enhanced driving force for carrier separation and an extended depletion region for suppressing interfacial charge accumulation, thus alleviating J-V hysteresis effect. [11,19,69] This result was further confirmed by the increased recombination resistance (R rec ) fitted from electrochemical impedance spectroscopy (EIS) spectra (Figure S26b,c and Table S15, Supporting Information). In addition, the larger slopes (dash line in Figure S26a, Supporting Information) of modified devices indicated the lower interfacial charge densities, which is mainly attributed to released interfacial tensile stress and reduced film defects.…”
Section: Resultssupporting
confidence: 52%
“…A larger V bi value means an enhanced driving force for carrier separation and an extended depletion region for suppressing interfacial charge accumulation, thus alleviating J-V hysteresis effect. [11,19,69] This result was further confirmed by the increased recombination resistance (R rec ) fitted from electrochemical impedance spectroscopy (EIS) spectra (Figure S26b,c and Table S15, Supporting Information). In addition, the larger slopes (dash line in Figure S26a, Supporting Information) of modified devices indicated the lower interfacial charge densities, which is mainly attributed to released interfacial tensile stress and reduced film defects.…”
Section: Resultssupporting
confidence: 52%
“…The higher V bi values can give rise to a larger driving force for charge separation and induce an expanded depletion region to suppress interfacial charge accumulation/recombination, which is the main reason for the increased V oc and reduced J-V hysteresis in the modied devices. 14,70,71 We ascribed the increased V bi values to the adjusted interfacial energy level alignment at the ETL/ perovskite interface (Fig. S33b, ESI †).…”
Section: Resultsmentioning
confidence: 99%
“…The Fermi level of the control CsPbI 3 films was close to the VBM (0.74 eV), indicating the p-type nature. 47 When contacting PCBM, the Δ E CBM of the CsPbI 3 and PCBM was 0.35 eV, and the large energy level mismatch may lead to the formation of a huge energy-level gap and serious non-radiative recombination at the interface.…”
Section: Resultsmentioning
confidence: 99%