“…Apart from that, Joint EKF (JEKF) and Dual EKF (DEKF) are used for joint or sequential estimation of both states and parameters (Haykin, 2001). For recent of applications MPC, SMPC and other model-based control techniques, the articles Ma, Matusko, and Borrelli (2015), Bhadra, Panda, Bhowmick, Goswami, and Panda (2019), Wang, Chen, Ren, and Zhao (2018), Yuan, Dai, Wei, andMing (2020), Soumya Ranjan, Bidyadhar, andSubhojit (2017), Velarde, Maestre Ishii, and Negenborn (2018), Ringbeck, Garbade, and Sauer (2020), Liu and Guo (2021), Guo and Zhao (2022), Liu (2022), andGao et al (2020) can be referred.…”