1997
DOI: 10.1002/(sici)1097-4628(19970906)65:10<1975::aid-app15>3.3.co;2-0
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Physical properties of epoxy molding compound for semiconductor encapsulation according to the coupling treatment process change of silica

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“…Delamination can be initiated by a number of factors, one of which is a CTE mismatch between EMC and the die‐pad 5–7. Therefore, considerable research efforts have been devoted to the reduction of CTE mismatch by new resin synthesis,8–10 high filler loading,11, 12 or surface modification of fillers for enhanced adhesion to the base resin 13–15…”
Section: Introductionmentioning
confidence: 99%
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“…Delamination can be initiated by a number of factors, one of which is a CTE mismatch between EMC and the die‐pad 5–7. Therefore, considerable research efforts have been devoted to the reduction of CTE mismatch by new resin synthesis,8–10 high filler loading,11, 12 or surface modification of fillers for enhanced adhesion to the base resin 13–15…”
Section: Introductionmentioning
confidence: 99%
“…Among these approaches, the surface modification of silica fillers with silane coupling agents has been extensively investigated because silane coupling agents are known to promote chemical bonds between silica fillers and epoxy resin, thus providing excellent adhesion between them 16–18. In fact, use of silane coupling agents has been quite successful in enhancing the adhesion of silica fillers to epoxy resin, with the result that three methods have been introduced 14, 15. The best adhesion is rendered by the solution method despite the coagulation problem of silica fillers, which require a powdering process, whereas internal pretreatment and integral addition methods provide inferior adhesion compared to the solution method but without the coagulation problem.…”
Section: Introductionmentioning
confidence: 99%