2005
DOI: 10.1109/ted.2005.859638
|View full text |Cite
|
Sign up to set email alerts
|

Physical Layout Design Optimization of Integrated Spiral Inductors for Silicon-Based RFIC Applications

Abstract: A new test structure layout technique and design methodology are used to investigate quantitatively how geometrical layout parameters such as core diameter, conductor spacing, and width would affect the performance of spiral inductors. For the 0.18-m RFCMOS technology, experimental results in this paper reveal that inductors' core diameters must be adequately large, more than 100 m, to ensure high quality factor characteristics and their conductor spacing should be minimal to obtain larger per unit area induct… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

0
21
0

Year Published

2007
2007
2015
2015

Publication Types

Select...
3
2
1

Relationship

0
6

Authors

Journals

citations
Cited by 28 publications
(21 citation statements)
references
References 9 publications
0
21
0
Order By: Relevance
“…This is a very important prerequisite for device performance comparison at high frequencies as well as circuit optimization. As revealed in Figure 10 of [9], varying the inductor's number of turns is not a suitable solution since the inductance steps between different turns are too large and increase at much higher rates as number of turn increases. For example, from 2 to 3-turn, L increases by 0.8 nH ; from 7 to 8-turn, L increases by 3.54 nH.…”
Section: Test Structure Design Considerations and Experimental Setupmentioning
confidence: 99%
See 4 more Smart Citations
“…This is a very important prerequisite for device performance comparison at high frequencies as well as circuit optimization. As revealed in Figure 10 of [9], varying the inductor's number of turns is not a suitable solution since the inductance steps between different turns are too large and increase at much higher rates as number of turn increases. For example, from 2 to 3-turn, L increases by 0.8 nH ; from 7 to 8-turn, L increases by 3.54 nH.…”
Section: Test Structure Design Considerations and Experimental Setupmentioning
confidence: 99%
“…For example, 1.5-turn inductors are designed with widths from 8 to 32 µm and 6.5-turn inductors are designed with widths from 4 to 8 µm. From findings in [9], it would be a waste of expensive testchip resources if 6.5-turn inductors are drawn with width of 32 µm as their substrate losses will be too large, suffering self-resonance at very low frequencies and hence, completely not useful at all. Costly testchip space is better utilized if 1.5-turn symmetrical inductors are designed with widths of 32 µm which will reduce the peak Q-factor frequency and improves the Q-factor of these inductors at low GHz frequencies.…”
Section: Test Structure Design Considerations and Experimental Setupmentioning
confidence: 99%
See 3 more Smart Citations