2014
DOI: 10.1515/nanoph-2013-0043
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Photoconductive NSOM for mapping optoelectronic phases in nanostructures

Abstract: Abstract:The advent of optically functional materials with low-intensive processing methods is accompanied by a growing need for high resolution imaging to probe the inherent inhomogeneities in the underlying microstructure. Atomic force microscopy based techniques are typically utilized for imaging the surface of organic thin films, quantum dots and other nanomaterials with ultrahigh resolution. Several modes like conductive, Kelvin, electrostatic amongst others have been particularly successful in imaging th… Show more

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Cited by 8 publications
(6 citation statements)
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References 87 publications
(115 reference statements)
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“…88 One application of NSOM in excitation-only mode is light beam-induced current (LBIC) microscopy, where the photogenerated current can be spatially resolved at the nanoscale. 89 A spot size equivalent to the diameter of the aperture illuminates a solar cell and locally generates a flow of charge carriers. The photocurrent signal is typically detected by using the macroscopic contacts of the device.…”
Section: Acs Energy Lettersmentioning
confidence: 99%
“…88 One application of NSOM in excitation-only mode is light beam-induced current (LBIC) microscopy, where the photogenerated current can be spatially resolved at the nanoscale. 89 A spot size equivalent to the diameter of the aperture illuminates a solar cell and locally generates a flow of charge carriers. The photocurrent signal is typically detected by using the macroscopic contacts of the device.…”
Section: Acs Energy Lettersmentioning
confidence: 99%
“…SNOM has been initially well applied in the areas of CdTe/CdS solar cells, GaAs solar cells, organic solar cells, and so on. [36][37][38][39][40][41] These works all presented a thorough and organized understanding of carrier dynamics. Recently, there have appeared some excellent works explored the carrier behavior around the grain boundaries using SNOM for PSCs.…”
Section: Measurements Of Horizontal Defect Distributionmentioning
confidence: 99%
“…Near-field techniques probe spatial lengths much smaller than the diffraction limit, allowing to circumvent many of the challenges that complicate conventional TRTS. Implementations of steady-state (photo-)conductivity mapping range from scattering near-field microscopy using sharp tips [15][16][17][18][19], to experiments relying on microwaves or narrow band THz sources [20,21]. However, transient photoconductivity near-field measurements at THz frequencies have until recently remained largely unexplored [22,23].…”
Section: Introductionmentioning
confidence: 99%