2016
DOI: 10.12693/aphyspola.129.1245
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Peculiarities of Deposition Times on Gas Sensing Behaviour of Vanadium Oxide Thin Films

Abstract: The importance of vanadium oxide in solid state science as a semiconductor encouraged us to prepare and investigate its microstructure and surface properties related to gas sensing characteristics. Hence, vanadium oxide thin films were deposited by spray pyrolysis method. The prepared films were placed in an electric circuit and the sensing characteristics of these films to ethanol vapors were studied. It was possible to find correlations between nanostructure and electrical properties of the obtained thin fil… Show more

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Cited by 19 publications
(6 citation statements)
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“…The root mean square and surface roughness ( R q ) were evaluated by considering the surface area of 3 μm × 3 μm from the AFM micrographs. The as-deposited ZnO:ZnGa 2 O 4 film exhibited the surface roughness of 9.34 nm, which was increased to 13.2 nm after annealing this film at 700 °C, indicating the favorable high surface roughness for gas-sensing sites to trap more NO molecules . The actual surface area of the films is larger than the projected surface area due to the presence of spherical grains.…”
Section: Resultsmentioning
confidence: 96%
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“…The root mean square and surface roughness ( R q ) were evaluated by considering the surface area of 3 μm × 3 μm from the AFM micrographs. The as-deposited ZnO:ZnGa 2 O 4 film exhibited the surface roughness of 9.34 nm, which was increased to 13.2 nm after annealing this film at 700 °C, indicating the favorable high surface roughness for gas-sensing sites to trap more NO molecules . The actual surface area of the films is larger than the projected surface area due to the presence of spherical grains.…”
Section: Resultsmentioning
confidence: 96%
“…The as-deposited ZnO:ZnGa 2 O 4 film exhibited the surface roughness of 9.34 nm, which was increased to 13.2 nm after annealing this film at 700 °C, indicating the favorable high surface roughness for gas-sensing sites to trap more NO molecules. 42 The actual surface area of the films is larger than the projected surface area due to the presence of spherical grains. The surface roughness of the ZnO:ZnGa 2 O 4 films decreased from 13.2 to 11.3 nm after annealing this film at 800 °C, as shown in Figure 4f, which can be attributed to the agglomeration of grains during annealing at a high temperature, indicating the difficulty in clearly distinguishing the grain boundaries.…”
Section: Methodsmentioning
confidence: 99%
“…The powder is indexed as phase pure orthorhombic V 2 O 5 , according to the standard data (Inorganic crystal structure database collection code-15984). The presence of a characteristic peak at 20.2° with panel (001) is evidence for the V 2 O 5 phase (Khatibani et al , 2016). MMT nanoclays diffractogram shows a characteristic peak at 2θ = 6.1° (001) with d-spacing 14.3° Å and other peaks 19.9° and 35.6° corresponding to (020) and (006) panels, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…42) Variation of the adsorption/desorption of oxygen ions may be the reason for the temperature dependence of the sensing performance. 43) It seems each gas has various adsorption/desorption parameters which lead to forming a distinguished temperature profile. Enhancement of sensing performance arising from thermal treatment can be related to thermal energy.…”
Section: Resultsmentioning
confidence: 99%