2014
DOI: 10.1016/j.colsurfb.2014.10.039
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Patterning of photocleavable zwitterionic polymer brush fabricated on silicon wafer

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Cited by 14 publications
(19 citation statements)
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“…This result suggests that poly(CMB‐ r ‐STMS) was decomposed at a low irradiation dose, which does not affect the surface modified with poly(CMB‐ r ‐MPTMS). This is in good agreement with the previous result obtained for a polymer brush having an aromatic ring at its base: the covalent binding between the polymer brush and the substrate could be more easily cleaved with the introduction of an aromatic ring …”
Section: Resultssupporting
confidence: 93%
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“…This result suggests that poly(CMB‐ r ‐STMS) was decomposed at a low irradiation dose, which does not affect the surface modified with poly(CMB‐ r ‐MPTMS). This is in good agreement with the previous result obtained for a polymer brush having an aromatic ring at its base: the covalent binding between the polymer brush and the substrate could be more easily cleaved with the introduction of an aromatic ring …”
Section: Resultssupporting
confidence: 93%
“…However, the presence or absence of 10% trimethoxysilyl group does not seem to affect the wettability of the copolymer‐modified surface significantly. With the sol–gel reaction, the hydrophilic CMB residues might be relatively more exposed to the solution phase, which would mainly lead to an increase in hydrophilicity of the surface …”
Section: Resultsmentioning
confidence: 99%
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