2022
DOI: 10.1109/tcad.2021.3079166
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PACT: An Extensible Parallel Thermal Simulator for Emerging Integration and Cooling Technologies

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Cited by 11 publications
(3 citation statements)
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“…Widely used modelling tools such as finite element models for thermal simulation [2] are lacking in this regard as the number of required elements and hence the computational time rapidly increases for capturing details at the smallest scales [3]. In order to solve this problem, there have been many efforts in recent studies to make the simulation process more efficient [4]. Recent fast compact thermal modelling methodologies for the temperature distribution prediction in 2D and 3D chip packages include the Hotspot tool [5], [6] and the Power Blurring method [7], [8].…”
Section: Introductionmentioning
confidence: 99%
“…Widely used modelling tools such as finite element models for thermal simulation [2] are lacking in this regard as the number of required elements and hence the computational time rapidly increases for capturing details at the smallest scales [3]. In order to solve this problem, there have been many efforts in recent studies to make the simulation process more efficient [4]. Recent fast compact thermal modelling methodologies for the temperature distribution prediction in 2D and 3D chip packages include the Hotspot tool [5], [6] and the Power Blurring method [7], [8].…”
Section: Introductionmentioning
confidence: 99%
“… is the node temperature matrix that can be solved from Equation 1 . This thermal RC equation matrix can be solved using differential solvers, such as LU decomposition solvers, to obtain the steady-state temperature of each thermal node ( Skadron et al., 2003 ; Yuan et al, 2021 ). Solving this first-order RC matrix is apparently faster than solving the second-order heat equations ( Pedram and Nazarian, 2006 ).…”
Section: Introductionmentioning
confidence: 99%
“…In Figure 1, when the chip is working, the temperature distribution on the chip is not uniform, especially for some large array and high-power chips, the overall temperature distribution has the characteristics of large drop and multi-center [2], and different operating temperatures also have an impact on the chip performance, which puts forward the demand for the on-chip temperature measurement function. Most of the existing image sensor solutions with temperature sensors use traditional integrated temperature sensors to be placed in the corners or surroundings of the image sensor chip, which is difficult to cover the entire chip, the temperature measurement effect is very limited, and it is difficult to achieve comprehensive and accurate image correction for each or part of the pixels.…”
mentioning
confidence: 99%