2011
DOI: 10.1002/adma.201102395
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Oxide Double‐Layer Nanocrossbar for Ultrahigh‐Density Bipolar Resistive Memory

Abstract: A TiO2/VO2 oxide double‐layer nanocrossbar to overcome the sneak path problem in bipolar resistive memory is proposed. TiO2 and VO2 thin films function as a bipolar resistive memory and a bidirectional switch, respectively. The new structure suggests that ultrahigh densities can be achieved with a 2D nanocrossbar array layout. By stacking into a 3D structure, the density can be even higher.

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Cited by 112 publications
(70 citation statements)
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References 27 publications
(38 reference statements)
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“…In particular, control over the switching voltages, where abrupt current changes occur by application of electric fields, is crucially important for stable performance of VO 2 devices. 3,4 Despite such importance, intentional control over the switching voltages has not been quantitatively investigated to date. We address a key question in this work: can the switching voltages be varied by changing the external parameters, and if they can, what is the origin of the variation?…”
mentioning
confidence: 99%
“…In particular, control over the switching voltages, where abrupt current changes occur by application of electric fields, is crucially important for stable performance of VO 2 devices. 3,4 Despite such importance, intentional control over the switching voltages has not been quantitatively investigated to date. We address a key question in this work: can the switching voltages be varied by changing the external parameters, and if they can, what is the origin of the variation?…”
mentioning
confidence: 99%
“…[1][2][3] Normally, vanadium can exhibit various oxidation states of V 2þ , V 3þ , V 4þ , or V 5þ to form the vanadium oxides of VO, V 2 O 3 , VO 2 , or V 2 O 5 . Among them, V 2 O 3 undergoes a metal-insulator transition (MIT) at 155 K, changing from a paramagnetic metal to an antiferromagnetic insulator, whereas the crystal structure has a transition from rhombohedra to monoclinic.…”
mentioning
confidence: 99%
“…1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 V. This behavior was similar to the RS reported for the CRS devices. [7][8][9] In fact, we fabricated more than 10 devices at 0.1 ≤ x ≤ 0.15. Among them, five devices exhibited CRS-like behavior with resistance ratio R HRS /R LRS ≈ 10 3 (Supporting Fig.…”
Section: Resultsmentioning
confidence: 98%
“…In addition, some Bi 1-x Sb x nanowires at 0.1 ≤ x ≤ 0.15 show complementary RS (CRS) -like behavior observed in CRS devices consisting of two bipolar memory cells that are antiserially connected. [7][8][9] Electric field-induced RS phenomena have usually been studied in oxides (including NiO x , TiO x , SiO x , and VO x ), perovskite oxides (including SrTiO 3 , and BiFeO 3 ), and chalcogenides (including AgS 2 and CuS 2 ). [10][11][12][13] These materials are initially in an insulating state, and a forming process is a prerequisite to change them to a bistable reversible state.…”
Section: Introductionmentioning
confidence: 99%