2012
DOI: 10.1002/adfm.201200185
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Origin of Enhanced Hole Injection in Inverted Organic Devices with Electron Accepting Interlayer

Abstract: Conventional organic light emitting devices have a bottom buffer interlayer placed underneath the hole transporting layer (HTL) to improve hole injection from the indium tin oxide (ITO) electrode. In this work, a substantial enhancement in hole injection efficiency is demonstrated when an electron accepting interlayer is evaporated on top of the HTL in an inverted device along with a top hole injection anode compared with the conventional device with a bottom hole injection anode. Current–voltage and space‐cha… Show more

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Cited by 77 publications
(55 citation statements)
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“…[19][20][21][22] In particular, transition metal oxides (i.e., MoO 3 ) doped organic semiconductor demonstrated special merits on improving device performance and stability. [23][24][25][26][27][28] In this letter, we report the improved performance including V oc and short-circuit current density (J sc ) simultaneously, in a pentacene/C 60 heterojunction OSC by using thin MoO 3 -pentacene film as the anode interfacial layer and the MCS layer, respectively. Compared with non-doped device, PCE is improved from 0.97% to 2.29%.…”
mentioning
confidence: 97%
“…[19][20][21][22] In particular, transition metal oxides (i.e., MoO 3 ) doped organic semiconductor demonstrated special merits on improving device performance and stability. [23][24][25][26][27][28] In this letter, we report the improved performance including V oc and short-circuit current density (J sc ) simultaneously, in a pentacene/C 60 heterojunction OSC by using thin MoO 3 -pentacene film as the anode interfacial layer and the MCS layer, respectively. Compared with non-doped device, PCE is improved from 0.97% to 2.29%.…”
mentioning
confidence: 97%
“…No light emission was detected from the hole-only devices during the measurement, implying that the electron was not injected and recombined with the hole. From the SCLC measurements, the zero field mobility of NPB was determined to be 2.15 Â 10 À4 cm 2 V À1 s À1 , which is consistent with values from literature [37,38]. The mobility of TDAB-BP (2.09 Â 10 À3 cm 2 V À1 s À1 in Table 1) is nearly one order of magnitude higher than that of NPB, which could be an alternative material to NPB and contribute to the better performance of OLEDs.…”
Section: Hole Mobility Propertiesmentioning
confidence: 64%
“…FF and V oc values in BHJ cells with MoO 3 or PEDOT: PSS buffers are close therefore the BHJ cell with PEDOT: PSS buffer gives an improved PCE of 6.26%. HAT-CN is an n-type organic semiconductor, but it can be used as the hole-extraction layer in organic light emitting devices [18][19][20]. Two-compound anode buffer layers, 5 nm MoO 3 /5 nm HAT-CN and PEDOT: PSS/5 nm HAT-CN, are also employed in DBP: C 70 BHJ cells for comparison.…”
Section: Resultsmentioning
confidence: 99%