2007
DOI: 10.1063/1.2800290
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Origin of efficiency droop in GaN-based light-emitting diodes

Abstract: The efficiency droop in GaInN∕GaN multiple-quantum well (MQW) light-emitting diodes is investigated. Measurements show that the efficiency droop, occurring under high injection conditions, is unrelated to junction temperature. Furthermore, the photoluminescence output as a function of excitation power shows no droop, indicating that the droop is not related to MQW efficiency but rather to the recombination of carriers outside the MQW region. Simulations show that polarization fields in the MQW and electron blo… Show more

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Cited by 1,257 publications
(821 citation statements)
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“…1) Although the origin of the efficiency droop is still the subject of controversy, [1][2][3][4] many studies suggest that it could originate from efficient Auger recombination of charge carriers confined in the quantum well (QW) plane. 2) One natural way to decrease the efficiency of Auger recombination is to decrease the charge carrier density in the QW, which can be achieved by increasing the thickness of the QW.…”
Section: Introductionmentioning
confidence: 99%
“…1) Although the origin of the efficiency droop is still the subject of controversy, [1][2][3][4] many studies suggest that it could originate from efficient Auger recombination of charge carriers confined in the quantum well (QW) plane. 2) One natural way to decrease the efficiency of Auger recombination is to decrease the charge carrier density in the QW, which can be achieved by increasing the thickness of the QW.…”
Section: Introductionmentioning
confidence: 99%
“…In addition, it allows to explore (001) oriented cubic SiC surfaces as needed for further heteroepitaxial growth of other cubic semiconductors. For example, the growth of cubic gallium nitride would be very beneficial to explore the more efficient white light emitting diodes due to less influence of the droop effect [9,10].…”
Section: Introductionmentioning
confidence: 99%
“…One source of efficiency loss in InGaN/GaN QW structures and LEDs is the thermal escape of carriers from the QW confining potential before they recombine [21,22]. The RT IQE of InGaN/GaN MQW structures, and LEDs, without prelayers has been measured to increase with increasing number of QWs, an effect which has been attributed to the recapture of carriers by adjacent QWs [23,24].…”
Section: Resultsmentioning
confidence: 91%