2018
DOI: 10.1007/978-3-319-93351-1_77
|View full text |Cite
|
Sign up to set email alerts
|

Optimal Productivity in Solar Power Plants Based on Machine Learning and Engineering Management

Abstract: The complexity of solar power plants is constantly increasing. This sophistication includes the increasing number of solar panels installed and the technologies that are employed in the energy conversion systems. The new solar plants require advanced methods to ensure the availability of all the panels. This paper proposes a recurrent convolutional neural network algorithm for detecting failures, reducing the costs and the time of the inspections. The method is aimed to analyze the data provided by an unmanned… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
10
0

Year Published

2019
2019
2024
2024

Publication Types

Select...
4
3

Relationship

0
7

Authors

Journals

citations
Cited by 14 publications
(10 citation statements)
references
References 20 publications
0
10
0
Order By: Relevance
“…Alsafasfeh, M., et al [2] yes yes Hwang, M.-H., et al [4] yes bypass diode Libra, M., et al [8] yes yes Niccolai, A., et al [9] yes digital map Vieira, R.G., et al [10] yes bypass diode Navid, Q., et al [11] yes Henry, C., et al [12] yes yes Pierdicca, R., et al [13] yes yes deep learning Jeong, H., et al [14] yes yes diagnosis Boulhidja, S., et al [15] yes Tsanakas, J.A., et al [16] yes yes Tsanakas, J.A., et al [17] yes Gallardo-Saavedra, S., et al [18] yes Ballestín-Fuertes, J., et al [19] EL 1 Herraiz, Á.H., et al [20] yes yes Fernández, A., et al [21] yes yes 1 Electroluminescence Technique.…”
Section: Other Defect Detectionmentioning
confidence: 99%
“…Alsafasfeh, M., et al [2] yes yes Hwang, M.-H., et al [4] yes bypass diode Libra, M., et al [8] yes yes Niccolai, A., et al [9] yes digital map Vieira, R.G., et al [10] yes bypass diode Navid, Q., et al [11] yes Henry, C., et al [12] yes yes Pierdicca, R., et al [13] yes yes deep learning Jeong, H., et al [14] yes yes diagnosis Boulhidja, S., et al [15] yes Tsanakas, J.A., et al [16] yes yes Tsanakas, J.A., et al [17] yes Gallardo-Saavedra, S., et al [18] yes Ballestín-Fuertes, J., et al [19] EL 1 Herraiz, Á.H., et al [20] yes yes Fernández, A., et al [21] yes yes 1 Electroluminescence Technique.…”
Section: Other Defect Detectionmentioning
confidence: 99%
“…The design and development of novel neural network is not the main objective of this paper. The R-CNN developed by Huerta et al [28] to validate the approach presented in this paper. The fault detection by neural network provides three variables about the failure: bbox, score and label.…”
Section: R-cnn and Statistical Analysis: Real Case Studymentioning
confidence: 99%
“…Kaplani [27] analyses the degradation effect with I-V curve, IR thermography and an algorithm is developed for detecting discoloration in PV cells. Huerta et al [28] proposes a recurrent convolutional neural network for the identification of hot spots. Segovia et al [29] developed a real case study based of simulating dust in PV panel and analyse the thermal data.…”
Section: Introductionmentioning
confidence: 99%
“…The temperature extracted is in the form of excel file that helps in finding pixel co-ordinates of the faults. From the excel file we can find maximum temperature and locate co-ordinates onto the image [4]. Since the images captured were not according to the rules of thermography, this approach cannot give us accurate results.…”
Section: A Temperature Extractionmentioning
confidence: 99%