2016
DOI: 10.1016/j.solmat.2015.12.036
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Optical methodology for process monitoring of chalcopyrite photovoltaic technologies: Application to low cost Cu(In,Ga)(S,Se)2 electrodeposition based processes

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Cited by 51 publications
(46 citation statements)
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“…The EL image acquired by the InGaAs camera (Figure a) is much more inhomogeneous than the image acquired by the silicon camera (Figure b). The EL image acquired by the InGaAs camera gives a better representation of the overall EL intensity than the Si camera because of its flat QE in the spectral range of the EL emission . The EL image acquired by the silicon camera may be misleading because the silicon camera acquires only the high energy part of the EL spectrum; therefore, the image tends to show higher EL intensity where the bandgap is higher, and not necessarily where the overall EL signal is higher.…”
Section: Discussionmentioning
confidence: 99%
“…The EL image acquired by the InGaAs camera (Figure a) is much more inhomogeneous than the image acquired by the silicon camera (Figure b). The EL image acquired by the InGaAs camera gives a better representation of the overall EL intensity than the Si camera because of its flat QE in the spectral range of the EL emission . The EL image acquired by the silicon camera may be misleading because the silicon camera acquires only the high energy part of the EL spectrum; therefore, the image tends to show higher EL intensity where the bandgap is higher, and not necessarily where the overall EL signal is higher.…”
Section: Discussionmentioning
confidence: 99%
“…The 785‐nm excitation wavelength was used for 2 reasons. The first one is due to the low interaction of this wavelength with the upper window layer that allows to characterize the absorber without removing the CdS/ZnO/ITO layers . The second advantage is related to the coupling of the energy of the excitation photons with the direct band gap of SnSe 2 .…”
Section: Methodsmentioning
confidence: 99%
“…The first one is due to the low interaction of this wavelength with the upper window layer that allows to characterize the absorber without removing the CdS/ZnO/ITO layers. 42 The second advantage is related to the coupling of the energy of the excitation photons with the direct band gap of SnSe 2 . This allows to work under resonant conditions largely increasing the sensitivity of the Raman measurements of this phase by several orders of magnitude.…”
Section: Characterizationmentioning
confidence: 99%
“…Hyperspectral imaging techniques have the potential to provide information regarding the optoelectronic properties of materials and devices with spatial resolution (Unold and Gütay, 2016;Oliva et al, 2016). In contrast to conventional luminescence spectroscopy measurements where the emitted light is collected from a single spot, hyperspectral imaging luminescence offers the possibility to acquire spatially-resolved luminescence maps within a single measurement cycle where the whole sample is illuminated homogeneously.…”
Section: Optical Spectroscopymentioning
confidence: 99%