2016
DOI: 10.1016/j.ultras.2015.12.001
|View full text |Cite
|
Sign up to set email alerts
|

On the mechanism of ultrasonic loading effect in silicon-based Schottky diodes

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
4
0

Year Published

2016
2016
2022
2022

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 10 publications
(4 citation statements)
references
References 20 publications
0
4
0
Order By: Relevance
“…The extracted and literature values are shown in Table 1 for porous silicon samples and in Table 2 for silicon nanowires arrays. Thermal conductivity of the porous silicon samples decreases with porosity according to the following expression: 𝜅 𝑠 = (1 − 𝑃) 3 𝜅 𝑆𝑖 . 36 As one can see, the heat capacity also decreases with increasing porosity of the layer.…”
Section: Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“…The extracted and literature values are shown in Table 1 for porous silicon samples and in Table 2 for silicon nanowires arrays. Thermal conductivity of the porous silicon samples decreases with porosity according to the following expression: 𝜅 𝑠 = (1 − 𝑃) 3 𝜅 𝑆𝑖 . 36 As one can see, the heat capacity also decreases with increasing porosity of the layer.…”
Section: Resultsmentioning
confidence: 99%
“…Silicon-based materials are "sine qua non" in micro/nano/opto-electronics [1][2][3][4][5] . The continuous size reduction of such devices and the growing aspect of their efficient integration naturally lead to improve thermal management.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Ultrasound is used to induce a diode effect in Re x Mn 1-x S (Re=Yb, Tm) [22] and in Mo/n-n⁺-Si [23][24] structures. It is assumed that this effect is due to the thermionic emission (at high temperature) and the phonon-assisted tunneling (at low temperature).…”
Section: Introductionmentioning
confidence: 99%