2020
DOI: 10.1016/j.nima.2019.163366
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ODIn — A setup for Off-line Deposit Irradiations of thin layers for nuclear physics applications

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“…This way, the characteristic X-rays of the elements present in the sample can be measured, leading to a qualitative and quantitative elemental analysis of the constituents [56,58]. Further information is accessible via Raman spectroscopy, as first studies with lead films show [59][60][61].…”
Section: Analyticsmentioning
confidence: 99%
“…This way, the characteristic X-rays of the elements present in the sample can be measured, leading to a qualitative and quantitative elemental analysis of the constituents [56,58]. Further information is accessible via Raman spectroscopy, as first studies with lead films show [59][60][61].…”
Section: Analyticsmentioning
confidence: 99%