Non-intrusive temperature measurement of NSOM probes with thermoreflectance imaging

Soni, Alok; Wen, Sy-Bor

doi:10.1088/0022-3727/45/18/185101

Cited by 8 publications

(4 citation statements)

References 26 publications

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“…Below, we will assess the back transmission throughput (from tip to fiber input end) κ of photons overlapping the aperture of an NSOM fiber tip, as the detected signal level is quite low for NSOM tips which have small apertures. However, increasing the focus power (few mW) can cause excessive heating, which can melt the gold layer on the fiber tip [25].…”

Section: Methodsmentioning

confidence: 99%

Measurement of the depletion beam focal spot using near-field scanning optical microscopy probes

McBride¹,

Su²

2013

Meas. Sci. Technol.

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The submicron size doughnut shape focal spot, which is traditionally measured by scattering off a nanoparticle or a fluorescent bead, is measured for the first time by a near-field scanning optical microscopy (NSOM) fiber probe. Measurement results agree very well with calculations. This method offers superior repeatability, better control and is less time-consuming than the traditional method as the probes are mechanically protected by their insertion into fiber optic ferrules, which also greatly facilitates the alignment of the tip to the focal spot.

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Section: Methodsmentioning

confidence: 99%

Measurement of the depletion beam focal spot using near-field scanning optical microscopy probes

McBride¹,

Su²

2013

Meas. Sci. Technol.

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“…This paper presents scanning thermoreflectance microscopy [26][27][28] for steady and transient thermal characterizations of microdevices. In thermoreflectance measurements, the reflected signal of an incident light source is collected and analyzed 29,30 while a sample of interest is being heated. When compared to the Raman spectroscopy, acquiring the optical reflection greatly simplifies measurement procedure and setup, and can improve the temporal resolution significantly.…”

Section: Introductionmentioning

confidence: 99%

Temperature measurements of heated microcantilevers using scanning thermoreflectance microscopy

Kim

Han

Walsh

et al. 2013

Review of Scientific Instruments

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We report the development of scanning thermoreflectance thermometry and its application for steady and dynamic temperature measurement of a heated microcantilever. The local thermoreflectance signal of the heated microcantilever was calibrated to temperature while the cantilever was under steady and periodic heating operation. The temperature resolution of our approach is 0.6 K, and the spatial resolution is 2 μm, which are comparable to micro-Raman thermometry. However, the temporal resolution of our approach is about 10 μsec, which is significantly faster than micro-Raman thermometry. When the heated microcantilever is periodically heated with frequency up to 100 kHz, we can measure both the in-phase and out-of-phase components of the temperature oscillation. For increasing heating frequency, the measured cantilever AC temperature distribution tends to be confined in the vicinity of the heater region and becomes increasingly out of phase with the driving signal. These results compare well with finite element simulations.

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“…Semi‐invasive thermographic methods are based on the use of thermosensitive coatings consisting of an indicator liquid crystal or fluorescent inorganic based compounds . Alternatively, the direct imaging of high temperature changes is possible by thermoreflectance microscopy, which is based on measuring the relative change of optical reflectivity with temperature, allowing for high resolution noncontact thermal imaging down to the microscale . Alternative methods on the basis of microresonators are envisioned for the imaging at room temperature .…”

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confidence: 99%

A Novel Scheme of Thermographic Microimaging Using Pyro‐Magneto‐Optical Indicator Films

Kustov

Гречишкин

Gusev³

et al. 2015

Advanced Materials

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Non-intrusive temperature measurement of NSOM probes with thermoreflectance imaging

Cited by 8 publications

References 26 publications

Measurement of the depletion beam focal spot using near-field scanning optical microscopy probes

Measurement of the depletion beam focal spot using near-field scanning optical microscopy probes

Temperature measurements of heated microcantilevers using scanning thermoreflectance microscopy

A Novel Scheme of Thermographic Microimaging Using Pyro‐Magneto‐Optical Indicator Films

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