2016
DOI: 10.1007/s00170-016-9494-3
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Non-contact on-machine measurement using a chromatic confocal probe for an ultra-precision turning machine

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Cited by 73 publications
(33 citation statements)
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“…The confocal microscopic measurement method has the ability to perform axial chromatography, which can measure the 3D morphology of the measured sample combined with transverse scanning. Chromatic confocal measurement is a representative confocal microscopy technique with nanoscale measurement resolution and measurement accuracy, which can be directly evaluated by spectral signal to obtain the position height information of the point along the optical axis on the surface of the workpiece [12,13]. Nanovea, in the United States, realizes an accurate measurement of the surface topography of the DOE based on the ST400 3D non-contact surface profilometer, developed by a confocal probe, which allows the height and spacing information of the diffraction structure to be determined.…”
Section: Introductionmentioning
confidence: 99%
“…The confocal microscopic measurement method has the ability to perform axial chromatography, which can measure the 3D morphology of the measured sample combined with transverse scanning. Chromatic confocal measurement is a representative confocal microscopy technique with nanoscale measurement resolution and measurement accuracy, which can be directly evaluated by spectral signal to obtain the position height information of the point along the optical axis on the surface of the workpiece [12,13]. Nanovea, in the United States, realizes an accurate measurement of the surface topography of the DOE based on the ST400 3D non-contact surface profilometer, developed by a confocal probe, which allows the height and spacing information of the diffraction structure to be determined.…”
Section: Introductionmentioning
confidence: 99%
“…Optical profilers and interference microscopes provide feasible and noncontact ways to achieve microscopic measurement. The point-to-point sampling data in profilers [4,5] needs to be spliced to obtain the full-aperture surface; besides, the measurement with the profiler is inefficient, time-consuming and can be easily affected by scanning mechanism precision and environmental disturbance. The interference microscope [6][7][8][9] has been serving as an accurate, highly efficient way for the roughness measurement.…”
Section: Introductionmentioning
confidence: 99%
“…It is usually necessary to remove the part from the machine for off-line metrology and then remount it back to the machine if the part is not fabricated to the specification, increasing the fabrication time and introducing extra errors. Various on-machine metrology or inprocess inspection techniques, 1,2 including hybrid vision system, 3 chromatic confocal, [4][5][6] deflectometry, 7 and interferometry, [8][9][10] have been developed to address this issue. However, all these methods are designed for either measuring surface shape or surface roughness, but not both.…”
Section: Introductionmentioning
confidence: 99%