At.Spectrosc. 2020 DOI: 10.46770/as.2020.05.002 View full text
Guo-Qiang Tang, Yu Liu, Lian-Jun Feng, Gang-Jian Wei, Wen Su, Yang Li, Guo-Hao Ren, Xian-Hua Li

Abstract: Silicon dioxide (SiO2) occurs as both crystallized quartz and amorphous quartz, and their oxygen isotope is widely used to trace the source of hydrothermal fluids, to reconstruct paleotemperature of oceans and to provide genetic constraints on petrogenetic studies. Precise and accurate oxygen isotope analysis, therefore, is fundamental for the application of oxygen isotope study. Secondary Ion Mass Spectrometry (SIMS) is capable of obtaining oxygen isotope information at micron levels, but precise and accurate…

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