New model for ion neutralization at surfaces

Goldberg, E. C.; Monreal, R.; Flóres, F.; Brongersma, H.H.; Bauer, Péter

doi:10.1016/s0039-6028(99)00863-8

Cited by 49 publications

(34 citation statements)

References 19 publications

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“…The transition from low energy to intermediate energy regime is quite abrupt (between 2.0 and 2.25 keV), in perfect agreement with the reported threshold energy E th for reionization [14]. The physical origin of the decrease in P is obviously, that collision induced processes start to contribute, with P CIN > P CIR (otherwise P would increase rather than decrease), in qualitative agreement with theoretical findings [17,18]. Assuming P CIR 0, the reduction factor of 0:75 could be interpreted as (1-P CIN ) according to Eq.…”

Section: Volume 89 Number 26 P H Y S I C a L R E V I E W L E T T E Rsupporting

confidence: 87%

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Velocity Scaling of Ion Neutralization in Low Energy Ion Scattering

et al. 2002

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Section: Volume 89 Number 26 P H Y S I C a L R E V I E W L E T T E Rsupporting

confidence: 87%

“…(3) [17,18], while the absolute values of P for He and Al were, due to the complexity of the model, only in fair agreement with experiment.…”

Section: Volume 89 Number 26 P H Y S I C a L R E V I E W L E T T E Rmentioning

confidence: 86%

Velocity Scaling of Ion Neutralization in Low Energy Ion Scattering

et al. 2002

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“…To the best of our knowledge, the values of v c do not appear in the literature for the samples used herein, and so it is difficult to provide a direct comparison with this approximation. A survey of various metallic films [17][18][19] would indicate that v c tends to increase 20 as a function of v Ќ toward Ͼ10 8 cm/ s. Therefore, our estimate appears to agree, in order of magnitude, with other such metallic samples.…”

Section: ͑3͒supporting

confidence: 77%

Effect of sample bias on backscattered ion spectroscopy in the helium ion microscope

Behan

Feng

Zhang

et al. 2010

Journal of Vacuum Science &Amp; Technology A: Vacuum, Surfaces, and Films

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The authors present experimental results showing the effect of an applied bias voltage on backscattered ion spectra acquired from thin films of ruthenium and hafnia in the helium ion microscope. A characteristic peak associated with the presence of a thin layer of material is observed to shift as a function of sample bias voltage. The magnitude of this shift is measured, and the authors qualitatively estimate the composition of their samples as well as investigate the neutralization of ions by the sample in the helium ion micoscope ͑HeIM͒. They discuss the phenomenona in terms of thin films of ruthenium and hafnia and show the implications of these results on HeIM spectroscopy.

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“…11,12,[17][18][19] Much work on this subject was performed by Boers 12 and later by Souda et al 17 For the neutralization process at close encounter we will use the term CIN ͑collision-induced neutralization͒, as introduced by Souda et al 17 During the violent collision between ion and target atom, the ground state of the ion can be promoted due to its interaction with the core levels of the target atom. [20][21][22] At small distances, of the order of 0.5 Å, the ground state of the ion is aligned with the bottom of the conduction band, enabling resonant charge exchange between the ground state and the levels at the bottom of the band ͑see Fig.…”

Section: B Collision-induced Neutralizationmentioning

confidence: 99%

“…Goldberg et al 19 performed ab initio calculations of the neutralization of He ϩ ions scattered from Pd and concluded that in this case CIN is not significant, but that AN is dominant. Assuming that the characteristic velocity for Pd in Fig.…”

Section: Auger Versus Collision-induced Neutralizationmentioning

confidence: 99%

Work function dependent neutralization of low-energy noble gas ions

et al. 2002

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The work function dependence of the neutralization of low-energy He ϩ , Ne ϩ , and Ar ϩ ions was studied by determining the neutralization probability of ions scattered from submonolayer coverages of Ba on W͑110͒ and Re͑0001͒ substrates. At high work functions ͑Ͼ3.5 eV͒, it was found that the dominant neutralization mechanism for noble gas ions with initial energy between 2 and 5 keV scattering from Ba is collision-induced neutralization. The neutralization probability for this mechanism was found to be insensitive to work function changes. We argue that collision-induced neutralization is also the dominant charge transfer process for scattering from other earth-alkali and alkali elements in this energy range, although at lower energies it is expected that Auger neutralization will become important. At work functions below roughly 3.5 eV, resonant neutralization to the first excited level of the noble gas ions occurs in addition to the charge transfer processes operating at high work functions. We show that the additional neutralization at low work functions can be described using resonant charge exchange theory. Due to resonant neutralization, the neutralization probability for noble gas ions increases exponentially with decreasing work function.

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New model for ion neutralization at surfaces

Cited by 49 publications

References 19 publications

Velocity Scaling of Ion Neutralization in Low Energy Ion Scattering

Velocity Scaling of Ion Neutralization in Low Energy Ion Scattering

Effect of sample bias on backscattered ion spectroscopy in the helium ion microscope

Work function dependent neutralization of low-energy noble gas ions

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