Nano-scale mapping of lattice strain and orientation inside carbon core SiC fibres by synchrotron X-ray diffraction

Baimpas, Nikolaos; Lunt, Alexander J.G.; Dolbnya, Igor P.; Dluhoš, Jiří; Korsunsky, Alexander M.

doi:10.1016/j.carbon.2014.07.045

Cited by 17 publications

(23 citation statements)

References 19 publications

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“…High resolution (nanoscale) pixel sizes are required to perform reliable DIC and therefore the length scale over which DIC markers can be analysed is limited to a few 10's of microns. This approach has therefore been developed for localised residual stress analysis [37]. In this study the parallel FIB milling technique has been applied to quantify the residual stresses within a few microns from the YPSZporcelain interface, close to the position at which porcelain chipping is known to originate [38].…”

Section: Parallel Fib Millingmentioning

confidence: 99%

Investigations into the interface failure of yttria partially stabilised zirconia - porcelain dental prostheses through microscale residual stress and phase quantification

et al. 2019

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Highlights  Residual stress and phase analysis at the microscale at interface and coping edge  X-ray diffraction and Raman spectroscopy show comparable results  Cross validation using ring-core focused ion beam and digital image correlation  Monoclinic and highly stressed regions identified close to interface  Phase transformation volumetric expansion is the origin of porcelain failure

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Section: Parallel Fib Millingmentioning

confidence: 99%

Investigations into the interface failure of yttria partially stabilised zirconia - porcelain dental prostheses through microscale residual stress and phase quantification

et al. 2019

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“…One such example is the development of residual stresses due to quenching in cylindrical specimens (Korsunsky et al [29]). Another example is provided by the residual stresses observed at the nanoscale within carbon monofilament cores of SiC fibres used as reinforcement for titanium alloy matrix composites (Baimpas et al [30]). Whilst residual stress analyses in these systems have been so far conducted using the inverse eigenstrain formulation within the framework, the present results open the possibility of an alternative approach using the integral equation formulation for which the present fundamental solution serves as a kernel.…”

Section: Introductionmentioning

confidence: 99%

Plane deformation of circular inhomogeneous inclusion problems with non-uniform symmetrical dilatational eigenstrain

Wang

Korsunsky

2015

Materials & Design

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“…(a) Radial and (b) hoop absolute strain distributions within the graphite and SiC regions of the core 101. The results of both the XRPD and the parallel FIB-DIC are shown as well as the comparable average XRPD results.…”

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confidence: 97%

“…Schematic of the XRPD set-up showing the aligned sample and diffraction patterns from the SiC and graphite regions 101. …”

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A state-of-the-art review of micron-scale spatially resolved residual stress analysis by FIB-DIC ring-core milling and other techniques

Lunt

Baimpas

Salvati

et al. 2015

The Journal of Strain Analysis for Engineering Design

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Quantification of residual stress gradients can provide great improvements in understanding the complex interactions between microstructure, mechanical state, mode(s) of failure and structural integrity. Highly focused local probe nondestructive techniques such as X-ray diffraction, electron diffraction or Raman spectroscopy have an established track record in determining spatial variations in the relative changes in residual stress with respect to a reference state for many structural materials. However, the interpretation of these measurements in terms of absolute stress values requires a strain-free sample often difficult to obtain due to the influence of chemistry, microstructure or processing route. With the increasing availability of focused ion beam instruments, a new approach has been developed which is known as the micro-scale ring-core focused ion beam-digital image correlation technique. This technique is becoming the principal tool for quantifying absolute in-plane residual stresses. It can be applied to a broad range of materials: crystalline and amorphous metallic alloys and ceramics, polymers, composites and biomaterials. The precise nano-scale positioning and welldefined gauge volume of this experimental technique make it eminently suitable for spatially resolved analysis, that is, residual stress profiling and mapping. Following a summary of micro-stress evaluation approaches, we focus our attention on focused ion beam-digital image correlation methods and assess the application of micro-scale ring-core methods for spatially resolved residual stress profiling. The sequential ring-core milling focused ion beam-digital image correlation method allows micro-to macro-scale mapping at the step of 10-1000 mm, while the parallel focused ion beam-digital image correlation approach exploits simultaneous milling operation to quantify stress profiles at the micron scale (1-10 mm). Cross-validation against X-ray diffraction results confirms that these approaches represent accurate, reliable and effective residual stress mapping methods.

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Nano-scale mapping of lattice strain and orientation inside carbon core SiC fibres by synchrotron X-ray diffraction

Cited by 17 publications

References 19 publications

Investigations into the interface failure of yttria partially stabilised zirconia - porcelain dental prostheses through microscale residual stress and phase quantification

Investigations into the interface failure of yttria partially stabilised zirconia - porcelain dental prostheses through microscale residual stress and phase quantification

Plane deformation of circular inhomogeneous inclusion problems with non-uniform symmetrical dilatational eigenstrain

A state-of-the-art review of micron-scale spatially resolved residual stress analysis by FIB-DIC ring-core milling and other techniques

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