2009
DOI: 10.1103/physrevb.79.125430
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Modifying the electronic structure of semiconducting single-walled carbon nanotubes byAr+ion irradiation

Abstract: Local controllable modification of the electronic structure of carbon nanomaterials is important for the development of carbon-based nanoelectronics. By combining density-functional theory simulations with Arion-irradiation experiments and low-temperature scanning tunneling microscopy and spectroscopy ͑STM/STS͒ characterization of the irradiated samples, we study the changes in the electronic structure of single-walled carbon nanotubes due to the impacts of energetic ions. As nearly all irradiation-induced def… Show more

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Cited by 47 publications
(30 citation statements)
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“…26 Spatially localized ion irradiation can also be used for local controllable modification of the electronic structure of carbon nanomaterials. With regard to semiconducting carbon nanotubes, individual irradiation-induced defects produced by Ar plasmas were shown to give rise to single and multiple peaks in the band gap of the nanotubes, and a similar effect has been demonstrated when several defects are close to each other 452 ͑Fig. 59͒.…”
Section: Electronic Propertiesmentioning
confidence: 99%
“…26 Spatially localized ion irradiation can also be used for local controllable modification of the electronic structure of carbon nanomaterials. With regard to semiconducting carbon nanotubes, individual irradiation-induced defects produced by Ar plasmas were shown to give rise to single and multiple peaks in the band gap of the nanotubes, and a similar effect has been demonstrated when several defects are close to each other 452 ͑Fig. 59͒.…”
Section: Electronic Propertiesmentioning
confidence: 99%
“…43−52 According to calculation, single vacancy, double vacancy, and carbon adatom defects each provide a single peak in the middle of the bandgap with a band dispersion at the level 50−70 meV ( Figure 6). 52 Other types of defects such as triple vacancies and Stone− Wales are capable of modifying locally the width of a bandgap. 52 Some of the modeling was done to account for experimentally observed features in low-temperature scanning tunneling microscopy and spectroscopy studies conducted on Ar-ion irradiated SWNTs, 52 although even in pristine SWNTs a significant presence of defects and disorder was revealed experimentally by the Coulomb blockade observed in low temperature electrical measurements, 53−55 selective electrochemical deposition imaging, 47 tip-enhanced Raman spectroscopy, 56 and high resolution photocurrent spectroscopy.…”
Section: Mechanism Of Conductivity Of the Network Of Semiconducting mentioning
confidence: 99%
“…52 Other types of defects such as triple vacancies and Stone− Wales are capable of modifying locally the width of a bandgap. 52 Some of the modeling was done to account for experimentally observed features in low-temperature scanning tunneling microscopy and spectroscopy studies conducted on Ar-ion irradiated SWNTs, 52 although even in pristine SWNTs a significant presence of defects and disorder was revealed experimentally by the Coulomb blockade observed in low temperature electrical measurements, 53−55 selective electrochemical deposition imaging, 47 tip-enhanced Raman spectroscopy, 56 and high resolution photocurrent spectroscopy. 25 The origin of the defects observed in pristine SWNTs has not been established; the defects may be formed during the SWNT synthesis or solution-based processing, which often includes air oxidation, acid treatment, solution based tip sonication, and centrifugation during exfoliation and sorting.…”
Section: Mechanism Of Conductivity Of the Network Of Semiconducting mentioning
confidence: 99%
“…defects by primary and secondary ion collisions [11][12][13], causing degradation of the SWCNT structural [14][15][16] and electrical properties [11,17,18]. Typically, SWCNT degradation caused by radiation exposure is undesirable [19], however, interest exists in utilizing controlled radiation conditions to intentionally modify or functionalize the SWCNT structures [20,21].…”
Section: Introductionmentioning
confidence: 98%