2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and 2022
DOI: 10.1109/eurosime54907.2022.9758893
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Modelling Thermal Fatigue in Power Electronics

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Cited by 5 publications
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“…To compare these results with the experimental cycle tests, these values must be converted into "mean cycle to failure numbers." For this purpose, a Manson-Coffin approach is used, which describes the thermal fatigue [23].…”
Section: Reliability and Modeling Methodsmentioning
confidence: 99%
“…To compare these results with the experimental cycle tests, these values must be converted into "mean cycle to failure numbers." For this purpose, a Manson-Coffin approach is used, which describes the thermal fatigue [23].…”
Section: Reliability and Modeling Methodsmentioning
confidence: 99%
“…In the literature, CZM has been implemented to simulate the many kinds of interfaces, including some applications related to polymers [ 8 ] and bonded joints [ 9 , 10 ]. Regarding power electronics applications, CZM has been used in copper-to-resin adhesion [ 11 ], solder joint interface delamination [ 12 ], the bonding/debonding behavior of bond pad structures [ 13 ], the debonding process of stiff film/compliant substrate systems [ 14 ], the failure mechanisms of stretchable electronics [ 15 ], the solder layer and semiconductor chip interface [ 16 ], and thermal fatigue [ 17 ], among others. Several approaches have been proposed in order to take into account the damage for fatigue loading, such as linking it to the maximum load the cycle [ 18 , 19 ] or the maximum principal strain [ 20 ] or including an unloading–reloading relation [ 21 , 22 ].…”
Section: Introductionmentioning
confidence: 99%