Modeling of Temperature-Dependent MOSFET Aging

Herrera, Fernando Avila; Miura-Mattausch, Mitiko; Kikuchihara, Hideyuki; Iizuka, T.; Mattausch, Hans Jürgen; Takatsuka, Hirotaka

doi:10.1109/sispad.2019.8870469

2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) 2019

DOI: 10.1109/sispad.2019.8870469

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Modeling of Temperature-Dependent MOSFET Aging

Fernando Avila Herrera

Mitiko Miura-Mattausch

Hideyuki Kikuchihara

et al.

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Modeling of Temperature-Dependent MOSFET Aging

Cited by 1 publication

References 4 publications

Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection

Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection

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