2020
DOI: 10.30970/jps.24.4701
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Modeling of ideality factor value in n+--p--p+-Si structure

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Cited by 1 publication
(4 citation statements)
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“…As seen from Figure 4C, at T=340 K, the maximum SRE is about 20, and SRE below 0.01 is observed for 55% of the samples whereas these values are equal to 0.02 and 83% at T=290 K (Figure 4B). It has been shown previously 52 that temperature rise causes the increase in the intrinsic recombination contributions to the ideality factor. As a result, the signature of Shockley‐Read‐Hall (SRH) recombination in n value becomes less prominent and DNN predictive ability decreases.…”
Section: Resultsmentioning
confidence: 92%
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“…As seen from Figure 4C, at T=340 K, the maximum SRE is about 20, and SRE below 0.01 is observed for 55% of the samples whereas these values are equal to 0.02 and 83% at T=290 K (Figure 4B). It has been shown previously 52 that temperature rise causes the increase in the intrinsic recombination contributions to the ideality factor. As a result, the signature of Shockley‐Read‐Hall (SRH) recombination in n value becomes less prominent and DNN predictive ability decreases.…”
Section: Resultsmentioning
confidence: 92%
“…For instance, our simulation reveals the n dependence on base thickness. 52 Nevertheless this dependence is weak, and the ideality factor value is mainly determined by depletion-region recombination.…”
Section: Datasetmentioning
confidence: 99%
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