2012
DOI: 10.1016/j.microrel.2012.06.137
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Modeling and simulation of an active restoring mechanism for high reliability switches in RF-MEMS technology

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Cited by 6 publications
(5 citation statements)
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“…The amount of heat flowing into the switch and therewith the achieved temperature rise strongly depends on the detailed design of the micro-heater and the surrounding oxide layers it is buried in. The impact of these geometrical features can be investigated and, hence, optimized applying the derived model, which is described explicitly in [6]. As a second fundamental result, forces acting on potentially welded contacts can be calculated.…”
Section: Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“…The amount of heat flowing into the switch and therewith the achieved temperature rise strongly depends on the detailed design of the micro-heater and the surrounding oxide layers it is buried in. The impact of these geometrical features can be investigated and, hence, optimized applying the derived model, which is described explicitly in [6]. As a second fundamental result, forces acting on potentially welded contacts can be calculated.…”
Section: Resultsmentioning
confidence: 99%
“…Exemplary results of these investigations and their interpretations, which are new compared to [6] are presented in the following. 9 shows a plot of the contact forces (circles) versus voltage applied to the micro-heater.…”
Section: Resultsmentioning
confidence: 99%
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“…In this section, we report on the electromechanical behaviour of the MEMS micro-relays employed in the 8-bit reconfigurable network. A 3D model of the sole MEMS switch is built with Ansys Workbench [34][35][36] and static structural simulations are performed, applying a voltage ramp in the range 0-100 V between the actuation electrodes and the underlying counterelectrodes. A vertical air-gap of 3 µm is set, and figure 3 shows the MEMS micro-relay as the pull-in takes place.…”
Section: Electromechanical Behaviour Of the Mems Switchesmentioning
confidence: 99%
“…Melle introduced a reliability modeling method to describe the dielectric charging kinetic [16]. In [17][18][19][20][21] typical structure failure phenomena, such as creep, fatigue and delamination of micro actuators, was analyzed based on Finite Element Method (FEM). However, physical modeling method regarding failure matters was still in its infancy stage.…”
Section: Introductionmentioning
confidence: 99%