Model of Inception and Growth of Damage from Microvoids in Polyethylene-based Materials for HVDC Cables. 2. Parametric Investigation and Data Fitting

Mazzanti, G.; Montanari, Gian Carlo; Civenni, F.

doi:10.1109/tdei.2007.4339486

Cited by 22 publications

(12 citation statements)

References 18 publications

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“…Significant research [2][3][4][5][6] has been carried out to study the degradation induced by this type of PD activity. In particular, a physical model of inception and growth of damage from micro-voids in polyethylene-based material under DC was presented in [7][8][9][10]. The results presented in this paper are obtained in the framework of developing an analytical model of the PD-induced degradation processes under AC voltage, occurring within cavities present in insulation systems.…”

Section: Introductionmentioning

confidence: 99%

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Relation between the trend of partial discharges and aging models under AC voltage

Wang

Testa

Cavallini

et al. 2009

2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials

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The research work reported in this paper has the aim to contribute in the development of a new physical aging model for damage inception and growth from micro-cavities in polymeric insulating materials subjected to partial discharges (PD) under AC voltage. Aging tests were performed on polyethylene (PE) layered specimens with cylindrical micro-cavities. The PD activity tak ing place inside the micro-cavities was monitored during the aging process. PD patterns, discharge repetition rates and discharge amplitudes were recorded. Common features can be extracted in the changing trend of PD repetition rate and discharge amplitude. Furthermore, damage growth rate, as well as degradation severity, are inferred through simple statistics.

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Section: Introductionmentioning

confidence: 99%

“…An expression for the life, L, of the insulation system is obtained by assuming that time-to-failure is the time to the formation of a damaged zone of critical size d-; with 978-1-4244-4368-0/09/$25.00 ©2009 IEEE 268 a damage growth rate R dis [5][6][7][8]:…”

Section: Introductionmentioning

confidence: 99%

Relation between the trend of partial discharges and aging models under AC voltage

Wang

Testa

Cavallini

et al. 2009

2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials

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“…Results obtained by Serra et al similarly show that the increase in length of micro-cavity results in increase in the number of electrons generated inside the micro-cavity [41]. Aging and life models by Montanari and coworkers [34,35] have similarly shown that the number of electrons generated inside the cavity increases with cavity length. The electrons generated inside the cavity are the main carriers of PD current [40,41].…”

Section: Micro-cavity Lengthmentioning

confidence: 85%

“…For a relatively short anode-cathode gap distance, the effect of the micro-cavity dimensions on the discharge characteristics, from experimental as well as theoretical findings, is evident [7,[30][31][32][33][34][35][36][37][38][39][40][41]. In this paper, the length of the micro-cavity is varied from 50 to 600 lm, while the applied electric field across micro-cavity is held constant at E = 10 6 V/m.…”

Section: Micro-cavity Lengthmentioning

confidence: 88%

A parametric study on the PD pulses activity within micro-cavities

Ganjovi

2015

J Theor Appl Phys

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A two-dimensional kinetic model has been used to parametric investigation of the spark-type partial discharge pulses inside the micro-cavities. The model is based on particle-in-cell methods with Monte Carlo Collision techniques for modeling of collisions. Secondary processes like photo-emission and cathode-emission are considered. The micro-cavity may be sandwiched between two metallic conductors or two dielectrics. The discharge within the micro-cavity is studied in conjunction with the external circuit. The model is used to successfully simulate the evolution of the discharge and yield useful information about the build-up of space charge within the micro-cavity and the consequent modification of the applied electric field. The phase-space scatter plots for electrons, positive, and negative ions are obtained in order to understand the manner in which discharge progresses over time. The risetime and the magnitude of the discharge current pulse are obtained and are seen to be affected by micro-cavity dimensions, gas pressure within the micro-cavity, and the permittivity of surrounding dielectrics. The results have been compared with existing experimental, theoretical, and computational results, wherever possible. An attempt has been made to understand the nature of the variations in terms of the physical processes involved.

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“…An innovative aging model for polymeric insulation systems based on damage inception and growth physics at the level of microscopic cavities, has been developed in [1][2][3]. In this model the prevailing degradation mechanism was considered to be the hot electron induced bond-breaking process that accumulates in the polymer matrix at a microvoid-polymer interface, and is fed by subsequent electron avalanches generated in the microvoids.…”

Section: Introductionmentioning

confidence: 99%

Model of ageing inception and growth from microvoids in polyethylene-based materials under AC voltage

Montanari

Cavallini

Testa

et al. 2008

2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena

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Several degradation mechanisms may affect polymeric insulation system reliability. Some authors postulate that, even in a perfect dielectric, nanoscale cavities can enlarge due to various mechanisms (from mechanical fatigue to lowering of the degradation reaction energy barrier) up to a point where highly energetic phenomena, which bring about breakdown, can be incepted. Other authors are more focused on the inherent limits of manufacturing processes, which leave cavities within the insulation system whose size is large enough to cause electron avalanches, thus a measurable partial discharge (PD) activity, from the time the system is put in service or as a function of external factors (e.g. mechanical damage, thermal shrinking, overvoltages). Given the time scale of polymeric system failures, this latter mechanism seems to be more plausible. It is therefore worthwhile to investigate in depth the degradation rates associated with PD in micrometric cavities in polymeric insulation systems subjected to AC voltage. The proposed model is based on damage accumulation on cavity surfaces caused by PD phenomena. The main degradation mechanism associated with PD is considered to be the hotelectron induced bond-breaking process. This process accumulates with time, leading to the creation of a damaged region of critical size and, ultimately, to breakdown. The proposed model describes the defect induction and growth phase until treeing phenomena start, which is, normally, the largely prevailing component of breakdown time.

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Model of Inception and Growth of Damage from Microvoids in Polyethylene-based Materials for HVDC Cables. 2. Parametric Investigation and Data Fitting

Cited by 22 publications

References 18 publications

Relation between the trend of partial discharges and aging models under AC voltage

Relation between the trend of partial discharges and aging models under AC voltage

A parametric study on the PD pulses activity within micro-cavities

Model of ageing inception and growth from microvoids in polyethylene-based materials under AC voltage

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