2006
DOI: 10.1002/cvde.200500023
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MOCVD and ALD of High‐k Dielectric Oxides Using Alkoxide Precursors

Abstract: A number of high-permittivity (j) dielectric oxides are currently being investigated as alternatives to SiO 2 as the dielectric insulating layer in sub-0.1 lm CMOS technology. Metal-organic (MO)CVD and atomic layer deposition (ALD) are promising techniques for the deposition of these high-j dielectric oxides. In this paper it is shown how the use of "designed" metal alkoxide precursors, containing bidentate donor-functionalized alkoxide ligands, in MOCVD leads to a marked improvement in the physical properties… Show more

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Cited by 63 publications
(45 citation statements)
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“…A wide range of applications exists for ALD, e.g., high-j oxides for CMOS and DRAM technology, 8,9 solar cell manufacturing, 10 catalysts, 11 and others. [12][13][14][15][16][17] In order to improve the control of the deposition process, several models for ALD have been published in recent years.…”
Section: Introductionmentioning
confidence: 99%
“…A wide range of applications exists for ALD, e.g., high-j oxides for CMOS and DRAM technology, 8,9 solar cell manufacturing, 10 catalysts, 11 and others. [12][13][14][15][16][17] In order to improve the control of the deposition process, several models for ALD have been published in recent years.…”
Section: Introductionmentioning
confidence: 99%
“…A wide variety of Zr precursors have been investigated in MOCVD and ALD, including ZrCl 4 , [31,32] [Zr(OR) 4 ], [33] [Zr(thd) 4 ], [34] [Zr(NR 2 ) 4 ] (R = Me, Et), [35,36] [Zr(NO 3 ) 4 ]. [37] However, all have various problems associated with them (e.g., impurity incorporation, low reactivity, low thermal stability) and none have proved suitable for dual application in ALD and MOCVD.…”
Section: Introductionmentioning
confidence: 99%
“…[12,29] 2) Reactions of carboxylic acid compounds with metal oxide surfaces were extensively studied in ultrahigh vacuum. It is generally accepted that the carboxylic acids adsorb dissociatively.…”
mentioning
confidence: 99%
“…[10,11] Taking a closer look at the chemistry, it is noticed that the evolution of ALD follows a development which is similar to that of sol-gel chemistry. In both cases, approaches were pursued to improve the metal oxide formation, either by modifying the precursor [12,13] or by using alternative nonhydrolytic reactions. [9,[14][15][16][17] Inspired by non-aqueous sol-gel routes for the formation of metal oxides in solution, we introduce herein a new approach for the ALD of metal oxide films.…”
mentioning
confidence: 99%