2013
DOI: 10.1155/2013/912548
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Abstract: Nanoscale Cu/Nb multilayers with individual layer thicknesses of 2, 5, and 15 nm were prepared by d.c. magnetron sputtering. The cross-sectional morphologies of the multilayers were examined under transmission electron microscopy (TEM) as well as high resolution TEM, whilst the flow stresses were measured with nanoindentation. A unique cross-sectional microstructure comprising well-modulated and mixed regions was observed, causing length-scale-independent flow stresses not found in existing studies, and shear …

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