Microscopic characteristic and signal analysis of aging defects in epoxy/mica insulation bar under different stresses

Zhang, Xiaohong; Hu, Chunxiu; Gao, Junguo; Hu, Qingjuan

doi:10.1109/iseim.2005.193469

Proceedings of 2005 International Symposium on Electrical Insulating Materials, 2005. (ISEIM 2005). 2005

DOI: 10.1109/iseim.2005.193469

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Microscopic characteristic and signal analysis of aging defects in epoxy/mica insulation bar under different stresses

Xiaohong Zhang

Chunxiu Hu

Junguo Gao

et al.

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Microscopic characteristic and signal analysis of aging defects in epoxy/mica insulation bar under different stresses

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References 6 publications

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