2020
DOI: 10.1063/1.5142271
|View full text |Cite
|
Sign up to set email alerts
|

Microscope imaging mass spectrometry with a reflectron

Abstract: Multiple-ion-ejection multi-reflection time-of-flight mass spectrometry for singlereference mass measurements with lapping ion species Review of Scientific Instruments 91, 023201 (2020);

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

1
15
0

Year Published

2020
2020
2023
2023

Publication Types

Select...
4
1

Relationship

1
4

Authors

Journals

citations
Cited by 9 publications
(16 citation statements)
references
References 37 publications
1
15
0
Order By: Relevance
“…Figure a demonstrates that this property holds for electrodynamic PEDA as well, as the average recorded spatial resolution is 25 ± 3 μm between 300 and 600 Da. These results are consistent with the simulation (red trace) and with the expected resolution of the ion microscope with and without a PEDA pulse applied. ,, …”
Section: Resultssupporting
confidence: 90%
See 4 more Smart Citations
“…Figure a demonstrates that this property holds for electrodynamic PEDA as well, as the average recorded spatial resolution is 25 ± 3 μm between 300 and 600 Da. These results are consistent with the simulation (red trace) and with the expected resolution of the ion microscope with and without a PEDA pulse applied. ,, …”
Section: Resultssupporting
confidence: 90%
“…These results are consistent with the simulation (red trace) and with the expected resolution of the ion microscope with and without a PEDA pulse applied. 21 , 28 , 33 …”
Section: Resultsmentioning
confidence: 99%
See 3 more Smart Citations