“…The surface topography of the samples under study was characterized using statistical, fractal and functional parameters derived from AFM images containing sample height data. Appropriate numerical procedure was described elsewhere (Bramowicz et al, ; Kulesza & Bramowicz, ), and was successfully applied for spatial characterization of a variety of nanostructured samples, such as: Fe and Au nanoparticles in carbon films (Ţălu, Bramowicz, Kulesza, Shafiekhani, et al, 2015; Ţălu, Bramowicz, Kulesza, et al, 2016), metallic nanoflakes (Ţălu, Solaymani, Bramowicz, et al, ), ZnO films (Ţălu, Bramowicz, Kulesza, et al, 2016) etc.…”